Analysis of QTL for resistance to head smut (Sporisorium reiliana) in maize uri icon

abstract

  • Head smut of maize, caused by the fungus Sporisorium reiliana, is an important disease in the temperate maize-growing areas worldwide. In this study, we mapped and characterized quantitative trait loci (QTL) conferring resistance to S. reiliana using a F,:3 population of 184 families derived from a cross between Mol7 (resistant parent) and Huangzao4 (susceptible). The population was evaluated for resistance in replicated field trials with artificial inoculation of S. reiliana chlamydospores in Gongzhuling of Jilin Province and Harbin of Heilongjiang Province of China, two hot spots of head smut incidence, in 2003 and 2004. Genotypic and G x E variances for disease incidence were highly significant in the population. Heritability estimates for percentage disease incidence in the 2-location and 2-year evaluation ranged from 0.62 to 0.70. Composite interval mapping on a linkage map (1956.1 cM distance; 9.34 cM average interval) constructed with 84 SSR and 135 AFLP markers, identified five QTL, one each on chromosomes 1, 3 and 8 and two on chromosome 2, accounting for 5.0-43.7% of the phenotypic variance across four environments. One major QTL on chromosome 2 explaining up to 43.7% of the phenotypic variance can potentially be used in molecular marker-assisted selection for head smut resistance in maize. (C) 2007 Elsevier B.V. All rights reserved.

publication date

  • 2008
  • 2008
  • 2008